Reliability Investigations, Machine Vision Recognition, and Artificial Intelligence-Driven Protective Circuit Design of Extreme Temperature Fluctuations on Orange AlInGaP Light-Emitting Diodes

Chun-Yen Yang · Yu-Tung Chen · Kun-Pu Lee · Yu-Tzu Chou 等13人 · IEEE Transactions on Electron Devices · 2026年1月 · Vol.73

This study investigates the stability and degradation of AlInGaP-based yellow light-emitting diodes (LEDs) subjected to extreme temperature cycling between $106~^{\circ }$ C and $- 196~^{\circ }$ C. Over 120 min, significant changes in electrical a...